Zhizhen Precision Instrument (Qingdao) Co., Ltd.

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Alternating Gradient Magnetometer (AGM) System

+86-13335086685 Yao Jingli

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Industry Applications

Classification

Magnetic Measuring Instruments

Keywords

Product Description
Technical Indicators
Applications

Product Model:

LAGM-Alpha-RT

Product Overview

Our Alternating Gradient Magnetometer (AGM) System is primarily used for high-precision characterization of magnetic materials, and serves as a key tool for the development and production of magnetic materials and magnetic chip research. Through innovative principles, our system is designed with the laser Doppler vibrometry technology in place of traditional dual-crystal vibrometry technology. It can measure magnetic materials at the scale of 1E-8 emu, an increase of 1–2 orders of magnitude compared with similar products abroad. Supported by the fully automated control procedures, this system can measure sample magnetic hysteresis loops and automatically extract key parameters such as material saturation moment and coercivity.

Magnetic Moment Measurement
Sensitivity		1E-8 emu
Repeatability		±1%
Stability		±0.05%@full scale/day
Accuracy		1%
Sample size		8 mm * 8 mm and backwards compatible
Magnetic Field Measurement
Magnetic field accuracy		±0.05%@full scale/day
Magnetic Field Resolution		0.1 Oe
Magnetic Field Configuration
Air gap at the pole head	Magnet current	Magnetic field in the sample area	Gradient field
5 mm	12.75 A	> 2 T	> 300 Oe/cm
10 mm	12.75 A	> 1.6T	> 250 Oe/cm
15 mm	12.75 A	> 1.4 T	> 200 Oe/cm
20 mm	12.75 A	> 1.2T	> 150 Oe/cm
Magnetic field homogeneity range		± 1% Φ10mm

Other Indicators

● Our laser Doppler vibrometry technology is supported by a 632.8 nm Helium-Neon laser, providing a displacement resolution better than 1 pm and a velocity resolution better than 0.01 μm/s.

● The X-Y-Z three-axis translation stage & rotator is friendly for sampling, sample change and angular testing.

● The two carbon fiber sample rods are designed for testing strong and weak magnetic fields respectively.

● Our LabVIEW control program realizes fully automated frequency and field scanning tests.

Testing Cases:

Conduct magnetic hysteresis loop tests on film samples with perpendicular anisotropy at a rate of 2 s/point. The blue line indicates the raw data, while the red line indicates the corrected data.

Conduct magnetic hysteresis loop tests on film samples with in-plane anisotropy at a rate of 2 s/point.

Conduct magnetic hysteresis loop scanning tests on multilayer film samples at a rate of 4 s/point. The blue line indicates the raw data, while the red line indicates the corrected data.