Zhizhen Precision Instrument (Qingdao) Co., Ltd.

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Science and Technology Innovation Information Frontier

20

2024-08

One article to take you to understand the history of the development of scanning probe microscope

The history of Scanning probe Microscope (SPM) is a remarkable scientific progress, which lays the foundation of nanoscience and nanotechnology. Since the 1980 s, the emergence and preservation of SPM has not only enabled scientists to observe and manipulate materials with atomic and molecular precision, but also promoted research in many related fields. The following are the key milestones in SPM development:

2024-08-20

One article to take you to understand the history of the development of scanning probe microscope

20

2024-08

Dry goods! Understanding Atomic Force Microscopy

Atomic force Microscope (AFM) is a common scanning probe microscope, which uses the interaction between the micro-arm probe and the atomic force of the sample to detect the surface structure of the material. When the probe is close to the sample, the force between the two will cause the micro-cantilever to deflect or change in amplitude. These small changes are amplified by the optical lever and then captured by the detection system and converted into electrical signals, which are transmitted to the feedback system and the imaging system (as shown in the figure below). By recording a series of changes of the probe during the scanning process, the surface topography structure information is obtained.

2024-08-20

Dry goods! Understanding Atomic Force Microscopy

20

2024-08

Scanning probe microscope-multi-mode measurement

Magnetic force microscopy (Magnetic Force Microscope,MFM) is a scanning probe microscope specifically designed to image the magnetic distribution of the sample surface, obtaining information through the magnetic interaction between the probe and the sample.

2024-08-20

Scanning probe microscope-multi-mode measurement

20

2024-08

Atomic Force Microscope Multi-Environment Scanning-Under-Liquid Scanning

Atomic Force Microscope (AFM) is a kind of measuring equipment which uses micro-cantilever to sense and amplify the force between the probe tip on the micro-cantilever and the atoms of the sample, so as to characterize the surface morphology of the sample. It not only produces three-dimensional images of samples at atomic resolution in air, but also high-resolution images of sample surfaces in liquid environments.

2024-08-20

Atomic Force Microscope Multi-Environment Scanning-Under-Liquid Scanning

20

2024-08

Important progress has been made in the field of magnetic two-dimensional materials! To true precision instruments to help high-level scientific research workers publish SCI!

Two-dimensional ferromagnetic materials have a wide range of potential applications in the fields of electronics, spintronics and magnetic storage due to their thin-layer structure and unique physical properties. The research of these materials is very important to promote the development of related technologies. The low-temperature strong-field micro-laser Kerr microscopic imaging system has unique advantages in the study of two-dimensional ferromagnetic materials.

2024-08-20

Important progress has been made in the field of magnetic two-dimensional materials! To true precision instruments to help high-level scientific research workers publish SCI!

28

2024-05

Wonderful appearance, the rise of national goods! To true precision instruments successfully released atomic force microscope series products!

On May 24-26, at the first "Scientific Instrument Developers Conference", the atomic force microscope series products independently developed by Zhizhen Precision Instruments were released! Products released this time include multi-function atomic force microscopes (AtomicaPrecision) and wafer-scale atomic force microscopes (Wafer Mapper-M).

2024-05-28

Wonderful appearance, the rise of national goods! To true precision instruments successfully released atomic force microscope series products!

20

2024-08

Congratulations on the company's products selected into the Ministry of Industry and Information Technology Equipment Industry Division I Intelligent Testing Equipment Innovation Product Catalog (the first batch)

Recently, the multifunctional magneto-optical Kerr microscopic imaging system of Zhizhi Precision Instruments was selected into the intelligent detection equipment innovation product catalog (the first batch) of the Equipment Industry Division I of the Ministry of Industry and Information Technology.

2024-08-20

Congratulations on the company's products selected into the Ministry of Industry and Information Technology Equipment Industry Division I Intelligent Testing Equipment Innovation Product Catalog (the first batch)

21

2024-01

4 new breakthrough! Zhizheng Precision Instruments Led Approved National Key R & D Plan

Recently, the Ministry of Science and Technology announced the 2023 national key research and development plan "basic scientific research conditions and major scientific instruments and equipment research and development" key special project list, led by Zhizhen Precision Instruments (Qingdao) Co., Ltd., jointly with Qingdao University, Qingdao Harbin Engineering University Innovation Development Center, Shanghai Institute of Microsystems and Information Technology, Chinese Academy of Sciences, the "low-power high-temperature quantum superconducting interference magnetic field detector" project was successfully approved, this is the first time that Zhizhen Precision Instruments has received support from a national-level project, marking a further leap in our company's ability to undertake national-level technical research tasks and participate in solving scientific and technological problems that the country focuses on.

2024-01-21

4 new breakthrough! Zhizheng Precision Instruments Led Approved National Key R & D Plan

20

2024-01

Hand in hand, win-win cooperation! Welcome Yunlu to visit Zhizhen Precision Instruments!

Recently, the chairman of Qingdao yunlu advanced materials technology co., ltd (stock code: 688190, hereinafter referred to as "yunlu co., ltd.") and his party of technical backbone of yunlu co., ltd. visited zhizhen precision instruments. The purpose of this visit is to understand the company situation, R & D level and production capacity of Zhizhen precision instruments, so as to establish good trust and communication and form a long-term and stable cooperative relationship. Dr. Zhang Xueying, chairman and CTO of the company, Dr. Wang Lin, CEO of the company, and heads of relevant departments accompanied the reception.

2024-01-20

Hand in hand, win-win cooperation! Welcome Yunlu to visit Zhizhen Precision Instruments!

02

2023-12

Zhizhen Precision Instruments was shortlisted for the 12th batch of "Diamond Plan" enterprises in Tsinghua Science Park.

2023-12-02

Zhizhen Precision Instruments was shortlisted for the 12th batch of "Diamond Plan" enterprises in Tsinghua Science Park.
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