Manual In-Plane Magnetic Field Probe Station for Wafer-Level Testing
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Product Model:
PS1D-Manu8
Product Description:
● Our in-plane magnetic field probe station features a universal structural design, excluding the magnets, with the field homogeneity being ±1% φ2 mm;
● Real-time monitoring and feedback on the magnetic field intensity, with monitoring accuracy greater than 1%, ≤0.05 mT;
● Hold up to 8-inch wafers, downward compatible with 8-inch and 6-inch wafers and fragments;
● Compatible with up to 4 sets of probes (RF or DC testing);
● Equipment upgrade options: Upgrade the translation system to an electronic control one.
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● Magnetic field direction: in-plane
● Sample size: 8-inch (downward compatible with fragments)
● Type and quantity of probes: DC probes (4 sets) or microwave probes (4 sets)
● Parameters of the sample translation stage: XY manual travel ±100 mm, and adjustment accuracy 1 μm, with a locking device, Z-axis travel 10 mm, accuracy 10 μm; T-axis coarse adjustment 360°, fine adjustment ±5°, and minimum adjustment accuracy 5'; T-axis manual adjustment ±5°, minimum adjustment accuracy 5'
● Microscope type: monocular microscope
● Magnetic field direction and maximum magnetic field intensity: in-plane, 50 mT
Manual In-Plane Magnetic Field Probe Station for Wafer-Level Testing
Classification
Keywords
Intention Table
Application Industry
Provide reliable equipment for advanced manufacturing, empowering technological innovation through precision measurement!!
Contact Information
Business Inquiries:+86-532-89267428/13335086685Manager Yao
Switchboard:+86-532-89269848
Company Address: 393 Songling Road, Laoshan District, Qingdao, Shandong Province, China
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