Wafer-Level Manual In-Plane Magnetic Field Probe Station

Classification

Keywords

Product Model:

PS1D-Manu8

Product Introduction:

The wafer-level manual in-plane magnetic field probe station PS1D-Manu8 is a high-precision device designed for wafer testing, suitable for electrical and magnetic measurements in laboratories and enterprises. It provides a highly uniform in-plane magnetic field to ensure stable testing environments and is compatible with multiple sample sizes to meet diverse testing needs. With manually adjustable X/Y-axis displacement and 360° rotation, users can precisely control sample positioning.Equipped with 4 groups of DC or microwave probes, it easily achieves magnetoresistance and other testing functions.PS1D-Manu8 will assist in efficient and precise electrical/magnetic measurement and analysis.

Sample Size	Compatible with 8-inch and below
Magnetic Field Strength	50 mT
Magnetic Field Uniformity	Better than ±1%φ1 mm
Magnetic Field Resolution	PID closed-loop feedback regulation, resolution 0.05 mT
Sample Displacement Stage	XY manual stroke ±100 mm, adjustment resolution 1 μm; Z-axis stroke 10 mm, adjustment resolution 10 μm; T-axis 360° rotation, adjustment resolution 0.05°
Probe Seat	4 groups of DC probes
Optical Magnification	0.75 X~5 X
Source Meter	N5173B, Keithley 6221, Keithley 2182A
Testing Functions	RH testing