Lightweight Atomic Force Microscope-AtomExplorer

Classification

Keywords

Product Model:
AtomExplorer

Product Introduction:
The AtomExplorer Lightweight Atomic Force Microscope delivers sub-nanometer resolution for observing material surface topography and texture. It captures fine structures and minute features on material surfaces across scales from nanometers to micrometers, providing detailed visual information on material, chip and other sample surface topography. This product also integrates Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Kelvin Force Microscopy (KFM), and Atomic Force Microscopy (AFM). It offers high stability, excellent expandability, and customization services. As a high-precision topography characterization tool and a device for nanoscale magnetic and electrical measurements, it provides additional options and support for education, scientific research and industrial R&D.

Sample Size	Φ25 mm
Scanning Method	XYZ Three-Axis Full-Sample Scanning
Scanning Range	100 μmX100 μmX10 μm / 30 μmX30 μmX5 μm
Z-Axis Noise Level	0.04 nm
Tip Protection Technology	Safe Needle Insertion Mode
Image Sampling Points	32X32~4096X4096
Operating Mode	Tap Mode,Contact Mode,Lift Mode,Phase lmaging Mode
Multifunctional Measurements	Electrostatic Force Microscope (EFM), Scanning Kelvin Microscope (KPFM), Piezoelectric Force Microscope (PFM),Magnetic Force Microscope (MFM)