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Science and Technology Innovation Information Frontier

20

2024-08

One article to take you to understand the history of the development of scanning probe microscope

The history of Scanning probe Microscope (SPM) is a remarkable scientific progress, which lays the foundation of nanoscience and nanotechnology. Since the 1980 s, the emergence and preservation of SPM has not only enabled scientists to observe and manipulate materials with atomic and molecular precision, but also promoted research in many related fields. The following are the key milestones in SPM development:

2024-08-20

One article to take you to understand the history of the development of scanning probe microscope

20

2024-08

Dry goods! Understanding Atomic Force Microscopy

Atomic force Microscope (AFM) is a common scanning probe microscope, which uses the interaction between the micro-arm probe and the atomic force of the sample to detect the surface structure of the material. When the probe is close to the sample, the force between the two will cause the micro-cantilever to deflect or change in amplitude. These small changes are amplified by the optical lever and then captured by the detection system and converted into electrical signals, which are transmitted to the feedback system and the imaging system (as shown in the figure below). By recording a series of changes of the probe during the scanning process, the surface topography structure information is obtained.

2024-08-20

Dry goods! Understanding Atomic Force Microscopy

20

2024-08

Scanning probe microscope-multi-mode measurement

Magnetic force microscopy (Magnetic Force Microscope,MFM) is a scanning probe microscope specifically designed to image the magnetic distribution of the sample surface, obtaining information through the magnetic interaction between the probe and the sample.

2024-08-20

Scanning probe microscope-multi-mode measurement

20

2024-08

Atomic Force Microscope Multi-Environment Scanning-Under-Liquid Scanning

Atomic Force Microscope (AFM) is a kind of measuring equipment which uses micro-cantilever to sense and amplify the force between the probe tip on the micro-cantilever and the atoms of the sample, so as to characterize the surface morphology of the sample. It not only produces three-dimensional images of samples at atomic resolution in air, but also high-resolution images of sample surfaces in liquid environments.

2024-08-20

Atomic Force Microscope Multi-Environment Scanning-Under-Liquid Scanning
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