Wafer-Level Atomic Force Microscope

Classification

Keywords

Product Model:

AtomMax

Product Overview:

Using micro-cantilever probe structures, this instrument enables 3D morphology characterization of conductive, semiconductive, and insulating solid materials, achieving wafer-level large-sample morphology characterization. Combined with an optical image, the electrically driven sample positioning stage allows for 1 μm positioning accuracy within a 300 x 300 mm area. It features fully automated operations for lateral alignment, probe approach, and scanning parameter adjustments.
Tap mode

Morphological image of globulin sample

To True Precision:

international famous brand B:

Instances:

Potential of the Au-Ti strip electrode sheet

Scanning mode: KPFM (lift-mode)

Scanning range: 18μm × 18μm

Electrostatic force of the Au-Ti strip electrode sheet

Scanning mode: EFM (lift mode)

Scanning range: 18μm × 18μm

Magnetic domains in Fe-Ni thin films

Scanning mode: MFM (lift-mode)

Scanning range: 14μm × 14μm

PbTiO3-piezoelectric corresponding vertical amplitude image

Scanning mode: PFM (contact-mode)

Scanning range: 20μm × 20μm

Morphology of polystyrene spheres

Scanning mode: tapping

Scanning range: 10μm × 10μm

Morphological image of SiC whisker