• Wafer-level Atomic Force Microscope
Wafer-level Atomic Force Microscope
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  • Product Description
  • Technical Indicators
  • Applications
  • Product Model: 

    AtomMax

     

    Product Overview: 

    The microcantilever probe structure can be used to characterize the three-dimensional appearance of solid materials such as conductors, semiconductors, and insulators, and can achieve the morphology characterization of large samples at the wafer level. The electric sample positioning stage, combined with optical images, can achieve a positioning accuracy of 1 μm in a 200×200 mm area. The optical structure is integrated with the scanning head, making operation convenient.

  • Equipment Performance

    Sample size 8-inch wafer and backward compatible
    Scanning range 100 μm×100 μm×10 μm
    Scanning angle 0-360°
    Z-direction linearity 0.2%
    Noise level in the Z direction 0.06 nm
    Image sampling point 32×32 - 4096×4096
    Working mode Contact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode
    Multifunctional measurement

    Electrostatic force microscope (EFM), scanning Kelvin microscope (KFM), piezoelectric force microscope (PFM), magnetic force microscope (MFM);

    optional: Conductive atomic force microscope (C-AFM)

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    • CZTSSe film
    • Scanning mode: Lift Mode(KPFM)
    • Scanning range: 12 um x 12 um

     

     

    Wafer-Level Atomic Force Microscoperoscope 1

    • Electrostatic force of the Au-Ti strip electrode sheet
    • Scanning mode: EFM (lift mode)
    • Scanning range: 18μm * 18μm

     

     

    Wafer-Level Atomic Force Microscoperoscope 2

    • Magnetic domains in Fe-Ni thin films
    • Scanning mode: MFM (lift-mode)
    • Scanning range: 14μm * 14μm

     

     

    Wafer-Level Atomic Force Microscoperoscope 3

    • PbTiO3-piezoelectric corresponding vertical amplitude image
    • Scanning mode: PFM (contact-mode)
    • Scanning range: 20μm * 20μm

     

    Wafer-Level Atomic Force Microscoperoscope 4

    • Co/Pt Thin Film
    • Scanning Mode: Magnetic Force Microscopy (MFM)
    • Scanning Range: 25 μm * 25 μm

     

     

Intention Table

Application Industry

TRUTH INSTRUMENTS

Provide reliable equipment for advanced manufacturing, empowering technological innovation through precision measurement!!

Contact Information

Telephone

Business Inquiries:+86-532-89267428/13335086685Manager Yao

Telephone

Switchboard:+86-532-89269848

Address

Company Address: 393 Songling Road, Laoshan District, Qingdao, Shandong Province, China

WeChat Public Number

WeChat Official Account

bilibili account

Bilibili Account