Multifunctional Atomic Force Microscope
Classification
Keywords
- Product Description
- Technical Indicators
- Applications
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Product Model:
AtomEdge Pro
Product Introduction:
The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact, tapping, and non-contact, it offers users greater flexibility and precision in operation. Additionally, it integrates various functional modes such as Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Kelvin Microscopy, and Piezoelectric Force Microscopy, delivering robust stability and excellent expandability. Furthermore, functional modules can be flexibly customized to meet specific user requirements, delivering tailored solutions for particular research fields and creating a highly efficient, multi-purpose inspection platform.
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Equipment Performance
Sample Size 25 mm Scanning Method XYZ three-axis full sample scanning Scanning Range 100 μm×100 μm×10 μm Scanning Rate 0.1-30 Hz Noise Level In The Z Direction 0.04 nm Nonlinearity 0.02% in the XY direction and 0.08% in the Z direction Image Sampling Point The maximum resolution of the scanning probe image is 4096×4096 Working Mode Contact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode Multifunctional Measurement Electrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force microscope (PFM), magnetic force microscope (MFM), Scanning Capacitance Atomic Force Microscope(SCM)； Optional Function：Conductive Atomic Force Microscope(C-AFM) -
- Strontium titanate (STO)
- Scanning mode:Tap mode
- Scanningrange:4 um x4 μm
- Titanium Film - Aluminum Titanate Film
- Scanning Mode: Piezoresponse Force Microscopy (PFM)
- Scanning Range: 10 μmx10 μm
- Vanadium Sulfide Thin Film
- Scanning Mode: Electrostatic Force Microscopy (EFM)
- Scanning Range: 5 μm x 5 μm
- Vanadium Sulfide Thin Film
- Scanning Mode: Kelvin Probe Force Microscopy (KPFM)
- Scanning Range: 5 μm x 5 μm
- Maze domain andSkyrmions in MTJ stack:SAF/MgO/[Ta/Co/Pt]9
- Scanning Mode: Magnetic Force Microscopy (MFM)
- Scanning Range: 10 μm x 10 μm
- Co/Pt Thin Film
- Scanning Mode: Magnetic Force Microscopy (MFM)
- Scanning Range: 30 μm x 30 μm
- High Stationary phasepyrolytic graphite (HOPG)
- Scanning Mode: Tapping Mode
- Scanning Range: .45 um x 0.45 um
- Al₂O₃ Whisker Morphology
- Scanning Mode: Tapping Mode
- Scanning Range: 15 μm x 15 μm
- Epoxy Resin Polymer Morphology
- Scanning Mode: Tapping Mode
- Scanning Range: 7 μm x 7 μm
- Pt-Co Thin Film Magnetism
- Scanning Mode: MFM (Lift Mode)
- Scanning Range: 5 μm x 5 μm
- Lithium Niobate Thin Film
- Scanning Mode: Piezoresponse Force Microscopy (PFM)
- Scanning Range: 35 μm x 35 μm
- Bacillus Immobilis
- Scanning Mode: Topography Measurement
- Scanning Range: 3 μm x 3 μm
Multifunctional Atomic Force Microscope
Classification
Keywords
Intention Table
Application Industry
Provide reliable equipment for advanced manufacturing, empowering technological innovation through precision measurement!!
Contact Information
Business Inquiries:+86-532-89267428/13335086685Manager Yao
Switchboard:+86-532-89269848
Company Address: 393 Songling Road, Laoshan District, Qingdao, Shandong Province, China
WeChat Official Account
Bilibili Account