Multi-Functional Atomic Force Microscope
Classification
Keywords
- Product Description
- Technical Indicators
- Applications
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Product Model:
AtomEdge Pro
Product Description:
The AtomEdge small sample atomic force microscope enables 3D scanning and imaging of materials, electronic devices, and biological samples, with a resolution of up to 20 picometers. It is compatible with samples up to 4 inches in diameter and offers multiple operating modes, including contact, tapping, and non-contact modes, providing users with flexible and precise operation options.
Additionally, it integrates multiple functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, piezoelectric force microscopy, and nano-manipulation. It is highly stable and expandable, and can be extended with functionalities like near-field optics, Raman/fluorescence spectroscopy, external magnetic fields, and acoustic atomic force microscopy, making it a truly high-resolution small sample atomic force microscope.
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Tapping Mode
Image showing single-atomic-layer steps of strontium titanate, with a step height of 0.39 nm.
Truth Instruments:
Magnetic Force Microscopy (MFM)
Applications: magnetic nanomaterials, magnetic properties of biological samples, and magnetic structures of metals, alloys, composites, etc.
Truth Instruments:
Internationally renowned brand B:
Electrostatic Force Microscopy (EFM)
Applications: semiconductor devices, micro- and nano-electronic devices, surface charge distribution of nanomaterials, biological samples, etc.
Truth Instruments:
Internationally renowned brand B:
Scanning Kelvin Probe Force Microscopy (KPFM)
Applications: Both KPFM and EFM can characterize the surface electrical properties and their applications are similar, but KPFM can quantitatively measure the surface potential and work function, so it can be used in a wider range of scenarios.
Truth Instruments:
Internationally renowned brand B:
Piezoelectric Force Microscopy (PFM)
Applications: ferroelectric materials, piezoelectric materials, evaluation of electronic devices, study of material defects and interfaces, exploration of novel materials, etc.
Truth Instruments:
Internationally renowned brand B:
Nanomorphology of epoxy-resin-based polymer
Scanning mode: tapping
Scanning range: 7 μm × 7 μm
Morphology of the Au-Ti strip electrode sheet
Scanning mode: tapping
Scanning range: 18μm × 18μm
Morphological image of Al2O3 whisker
Cu-doped TiO2 thin films
Magnetic domains in Pt-Co thin films
Scanning mode: MFM (lift-mode)
Scanning range: 5μm × 5μm
Copolymer morphology of polyethylene and polyoctene (under liquid)
Scanning mode: tapping
Scanning range: 18μm × 18μm
Multi-Functional Atomic Force Microscope
Classification
Keywords
Intention Table
Application Industry
Provide reliable equipment for China's IC manufacturing, empowering technological innovation through precision measurement!
Contact Information
Business Inquiries:+86-532-89267428/13335086685Manager Yao
Switchboard:+86-532-89269848
Company Address: 393 Songling Road, Laoshan District, Qingdao, Shandong Province, China
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