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Nanomorphology Characterization Instruments

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Product Model:

AtomEdge

Product Description:

Overcomes the sample space limitations typically associated with conventional research AFMs., the AtomEdge Multi-Functional Atomic Force Microscope (AFM) can accommodate samples up to 4 inches in size, and has a variety of working modes such as contact, tapping, and non-contact, providing users with more flexible and precise operation options. Notably, this product is fully compatible with liquid-phase testing environments, this product offers robust support for biological and electrochemical research. Moreover, it integrates a variety of functional modes, including magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, piezoelectric force microscopy, etching and nanomanipulation, with high stability and excellent expansibility. In addition, according to practical needs, its extended functions cover near-field optics, Raman/fluorescence spectroscopy coupling, applied magnetic field, atomic force acoustic microscopy, etc., which makes it a high-resolution multifunctional AFM in the true sense of the term.
● Large 4-inch measurement, with a high compatibility

● Chinese-English operation interface, easy to use

● Open probe change, easy to operate

● Standard multi-mode, with a high cost performance

● XY-direction noise level: 0.2 nm for closed cycle, and 0.02 nm for open cycle

● Z-direction noise level: 0.04 nm for closed cycle, and 0.03 nm for open cycle

● Nonlinearity: XY-direction 0.15%, Z-direction 1%

● Scanning mode: Scan all samples in the X, Y, Z axes

● Scanning range: 90 μm × 90 μm × 9μm

● Scanning rate: 0.1 Hz–20 Hz

● Image sampling point: 32 × 32–4,000 × 4,000

● Sample size: maximum diameter of 100 mm, thickness of 10 mm, compatible with petri dishes with a diameter of 100 mm

● Working mode: contact, tapping and non-contact

● Suitable environment: air and liquid phase

● Versatile measurement capabilities: electrostatic force microscopy (EFM), scanning Kelvin probe force microscopy (KPFM), piezoelectric force microscopy (PFM), conductive atomic force microscopy (C-AFM), scanning capacitance force microscopy (SCFM), magnetic force microscopy (MFM), lateral force microscopy (LFM), nano-etching/processing, single-point force spectral curve, and force modulation mode
Tapping Mode

Image showing single-atomic-layer steps of strontium titanate, with a step height of 0.39 nm.

Truth Instruments:

Magnetic Force Microscopy (MFM)

Applications: magnetic nanomaterials, magnetic properties of biological samples, and magnetic structures of metals, alloys, composites, etc.

Truth Instruments:

Internationally renowned brand B:

Electrostatic Force Microscopy (EFM)

Applications: semiconductor devices, micro- and nano-electronic devices, surface charge distribution of nanomaterials, biological samples, etc.

Truth Instruments:

Internationally renowned brand B:

Scanning Kelvin Probe Force Microscopy (KPFM)

Applications: Both KPFM and EFM can characterize the surface electrical properties and their applications are similar, but KPFM can quantitatively measure the surface potential and work function, so it can be used in a wider range of scenarios.

Truth Instruments:

Internationally renowned brand B:

Piezoelectric Force Microscopy (PFM)

Applications: ferroelectric materials, piezoelectric materials, evaluation of electronic devices, study of material defects and interfaces, exploration of novel materials, etc.

Truth Instruments:

Internationally renowned brand B:

Nanomorphology of epoxy-resin-based polymer

Scanning mode: tapping

Scanning range: 7 μm × 7 μm

Morphology of the Au-Ti strip electrode sheet

Scanning mode: tapping

Scanning range: 18μm × 18μm

Morphological image of Al2O3 whisker

Cu-doped TiO2 thin films

Magnetic domains in Pt-Co thin films

Scanning mode: MFM (lift-mode)

Scanning range: 5μm × 5μm

Copolymer morphology of polyethylene and polyoctene (under liquid)

Scanning mode: tapping

Scanning range: 18μm × 18μm