Multifunctional Atomic Force Microscope
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Keywords
- Product Description
- Technical Indicators
- Applications
- Customer Achievements
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Product Model:
Atom Edge Pro
Product Introduction:
The Atom Edge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact, tapping, and non-contact, it offers users greater flexibility and precision in operation. Additionally, it integrates various functional modes such as Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Kelvin Microscopy, and Piezoelectric Force Microscopy, delivering robust stability and excellent expandability. Furthermore, functional modules can be flexibly customized to meet specific user requirements, delivering tailored solutions for particular research fields and creating a highly efficient, multi-purpose inspection platform.
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Equipment Performance
Sample Size 25 mm Scanning Method XYZ three-axis full sample scanning Scanning Range 100 μm×100 μm×10 μm Scanning Rate 0.1-30 Hz Noise Level In The Z Direction 0.04 nm Nonlinearity 0.02% in the XY direction and 0.08% in the Z direction Image Sampling Point The maximum resolution of the scanning probe image is 4096×4096 Working Mode Contact mode, tap mode, phase imaging mode, lift mode, multi-directional scanning mode Multifunctional Measurement Electrostatic force microscope (EFM), scanning Kelvin microscope (KPFM), piezoelectric force microscope (PFM), magnetic force microscope (MFM), Scanning Capacitance Atomic Force Microscope(SCM)； Optional Function：Conductive Atomic Force Microscope(C-AFM) -
- Strontium titanate (STO)
- Scanning mode:Tap mode
- Scanningrange:4 um x4 μm
- Titanium Film - Aluminum Titanate Film
- Scanning Mode: Piezoresponse Force Microscopy (PFM)
- Scanning Range: 10 μmx10 μm
- Vanadium Sulfide Thin Film
- Scanning Mode: Electrostatic Force Microscopy (EFM)
- Scanning Range: 5 μm x 5 μm
- Vanadium Sulfide Thin Film
- Scanning Mode: Kelvin Probe Force Microscopy (KPFM)
- Scanning Range: 5 μm x 5 μm
- Maze domain andSkyrmions in MTJ stack:SAF/MgO/[Ta/Co/Pt]9
- Scanning Mode: Magnetic Force Microscopy (MFM)
- Scanning Range: 10 μm x 10 μm
- Co/Pt Thin Film
- Scanning Mode: Magnetic Force Microscopy (MFM)
- Scanning Range: 30 μm x 30 μm
- High Stationary phasepyrolytic graphite (HOPG)
- Scanning Mode: Tapping Mode
- Scanning Range: .45 um x 0.45 um
- Al₂O₃ Whisker Morphology
- Scanning Mode: Tapping Mode
- Scanning Range: 15 μm x 15 μm
- Epoxy Resin Polymer Morphology
- Scanning Mode: Tapping Mode
- Scanning Range: 7 μm x 7 μm
- Pt-Co Thin Film Magnetism
- Scanning Mode: MFM (Lift Mode)
- Scanning Range: 5 μm x 5 μm
- Lithium Niobate Thin Film
- Scanning Mode: Piezoresponse Force Microscopy (PFM)
- Scanning Range: 35 μm x 35 μm
- Bacillus Immobilis
- Scanning Mode: Topography Measurement
- Scanning Range: 3 μm x 3 μm
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[1]Long-term photoinduced sustained cathodic protection enabled by a h-WO3/m-WO3/TiO2/ZnIn2S4 multi-phase junction layer with enhanced charge separation and electron storage, Chemical Engineering Journal, 2026
[2]Grain stress induces the formation of nano-domains in Ba0.7Sr0.3TiO3-based ceramics to enhance the energy storage performance, Journal of Energy Storage, 2026
[3]Giant Circular Dichroism in Proximitized WS₂ Spin-Valley Transistors for Complementary Optoelectronics and Reconfigurable Logics, Advanced Materials, 2026
[4]Europium doped amorphous iron oxyhydroxide ultra thin Nanolayer: A novel architecture for enhancing solar water splitting of bismuth vanadate photoanodes, Journal of Colloid and Interface Science, 2026
[5]FeCu bimetallic active sites construction via hexagonal boron nitride electron regulation for high-performance electro-Fenton degradation of Rhodamine B, Journal of Environmental Management, 2026
[6]Interfacial evolution and phase stability of waste polyethylene-modified bitumen with ethylene-vinyl acetate compatibilizer under long-term oxidative aging, Polymer Degradation and Stability, 2026
[7]Observation of topological Hall effect in synthetic antiferromagnetic skyrmion system, Applied Physics Letters, 2026
[8]Hierarchical bismuth vanadate photoanode comodified with cobalt-iron Prussian blue analogue and nickel-oxyhydroxide for efficient solar water oxidation, International Journal of Hydrogen Energy, 2025
[9]Rational design of BiVO₄/CoFe‑LDH@Ni₂(NO₃)₂(OH)₂ ternary photoanodes: synergistic built‑in electric field and oxygen vacancies for high‑efficiency solar water oxidation, International Journal of Hydrogen Energy, 2025
[10]Enhanced BiVO₄ photoanode through synergistic integration of multi‑metal layered double hydroxides and Ag nanoparticles for efficient photoelectrochemical water splitting, International Journal of Hydrogen Energy, 2025
[11]Characterization of hydrophobic modification of gelatin crosslinked vanillin edible coatings and its application in food preservation，International Journal of Biological Macromolecules，2025
Multifunctional Atomic Force Microscope
Classification
Keywords
Intention Table
Application Industry
Provide reliable equipment for advanced manufacturing, empowering technological innovation through precision measurement!!
Contact Information
Business Inquiries:+86-532-89267428/13335086685Manager Yao
Switchboard:+86-532-89269848
Company Address: Phase II of Changsheng Emerging Industrial Park, No. 169 Zhuzhou Road, Laoshan District, Qingdao, Shandong Province, China
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