[AtomEdge Pro Application Case] Achieving Nanoscale Precision Imaging of Room-Temperature Skyrmions in MTJs
Release time:
2025-11-13
In the fields of spintronics and next-generation magnetic random-access memory (MRAM), magnetic skyrmions are regarded as core candidates for building future high-performance information devices due to their unique topological stability and low driving current density. However, directly observing and precisely characterizing these nanoscale magnetic structures in magnetic tunnel junction (MTJ) stacks under room temperature conditions and compatible with actual devices has remained a key challenge in this field.
Recently, utilizing the AtomEdge Pro atomic force microscope, we have successfully achieved direct visualization and characterization of the existence states of magnetic skyrmions and maze domains within a complex SAF/MgO/[Ta/Co/Pt]~9~ MTJ stack at room temperature, marking a critical step towards the application of topological magnetic structures from fundamental research.
Research Highlights
Test Sample:
The SAF/MgO/[Ta/Co/Pt]~9~ is a complex magnetic multilayer thin-film heterostructure, whose precise stack design aims to induce the formation of skyrmions.
△ SAF/MgO/[Ta/Co/Pt]~9~ sample
Key Findings: Using the Magnetic Force Microscopy (MFM) mode of the AtomEdge Pro, within a 10µm × 10µm scanning area, we clearly revealed the coexistence of both skyrmion and maze domain magnetic domain structures on the sample surface.
△ Magnetic domain distribution map showing skyrmions (dot-like regions) and maze domains (strip-like regions) observed in the MTJ stack.
Quantitative Analysis: To further characterize the structures precisely, we performed line profile analysis on the images. The data show:
The diameter of the skyrmion marked by the red line is 234 nm (as shown in Figure b).
The domain width of the maze domain is 217 nm (as shown in Figure c).
a: Maze domain and Skyrmions in MTJ stack: SAF/MgO/[Ta/Co/Pt]₉ sample magnetic domain distribution map, red line marks a skyrmion, blue line marks a maze domain; b: Data corresponding to the red line in image a, analysis shows the diameter of this skyrmion is 234nm; c: Data corresponding to the blue line in image a, analysis shows the domain width of this maze domain is 217nm.
This result not only visually demonstrates the two magnetic domain morphologies but also provides sub-nanometer precision measurements of their sizes, offering valuable real-space evidence for understanding their formation mechanisms and stability.
AtomEdge Pro: How Does It Break Through the Characterization Bottleneck?
Traditional macroscopic magnetic characterization techniques (such as Vibrating Sample Magnetometry, Magneto-Optical Kerr Effect Microscopy) are limited by spatial resolution, making it difficult to perform fine imaging of nanoscale magnetic textures like skyrmions. The key reasons why AtomEdge Pro played a crucial role in this study lie in its core technical advantages:
Ultra-High Spatial Resolution: AtomEdge Pro utilizes highly sensitive magnetic probes to precisely detect changes in the magnetic force gradient on the sample surface, enabling spatial resolution at the nanoscale.
Accurate Quantitative Characterization: It not only "sees" but also "measures accurately." Through precise data analysis of MFM images, key physical parameters such as domain size, distribution, and morphology can be extracted, providing reliable experimental data for theoretical calculations and device design.
Powerful Sample Compatibility: The MTJ stack tested here is a multilayer film structure geared towards practical applications. AtomEdge Pro successfully performed non-destructive, high-resolution characterization on it, demonstrating its strong applicability in the study of complex device-level samples.
Scientific Value and Application Prospects
This successful test not only strongly demonstrates the performance of AtomEdge Pro but also holds significant importance for related research fields:
Advancing MRAM Research: Realizing and directly observing skyrmions in magnetic tunnel junctions is key to translating their potential into new-generation information devices. AtomEdge Pro provides decisive real-space evidence for verifying their existence, understanding their behavior, and ultimately connecting microscopic magnetic structures to macroscopic electrical properties.
Empowering Topological Magnetism: As a core characterization tool for topological magnetic structure research, AFM can provide reliable data support for exploring the formation mechanisms, stability, and device integration of skyrmions, accelerating the transition from fundamental physics to applied devices.
Expanding Frontier Applications: The capability demonstrated in this research can be widely applied in cutting-edge technological fields such as neuromorphic computing, brain-inspired intelligent hardware, high-frequency microwave communication, and sensing systems.
We believe that precise characterization is the cornerstone of scientific progress. The AtomEdge Pro atomic force microscope is committed to providing global researchers with powerful micro-scale analysis tools, helping you see clearer and go further in frontier exploration.
To learn more about the applications of AtomEdge Pro in magnetic materials, spintronics, and other cutting-edge fields, please feel free to contact us for technical exchange or to apply for sample testing.
Previous Page
Previous Page:
Least News
Provide reliable equipment for advanced manufacturing, empowering technological innovation through precision measurement!!
Contact Information
Business Inquiries:+86-532-89267428/13335086685Manager Yao
Switchboard:+86-532-89269848
Company Address: 393 Songling Road, Laoshan District, Qingdao, Shandong Province, China
WeChat Official Account
Bilibili Account