Expanding Its Footprint in Universities! TRUTH INSTRUMENTS AFM Successfully Delivered to Shanghai University


Recently, TRUTH INSTRUMENTS’ self-developed Atom Edge Pro Atomic Force Microscope (AFM) has been successfully delivered, installed and commissioned at Shanghai University. This marks another benchmark deployment of TRUTH INSTRUMENTS’ atomic force microscopes in key universities, supporting high-level research output with high-performance testing equipment.
As a key university under the national "211 Project", Shanghai University boasts profound research accumulation in materials science, electronic information and other fields. The delivered atomic force microscope from TRUTH INSTRUMENTS, with its exceptional noise control and high-resolution imaging capabilities, will provide robust hardware support for the university’s research on the characterization and performance analysis of material microstructures.
 
During the equipment delivery, TRUTH INSTRUMENTS’ technical team provided detailed installation, commissioning and operation training for the university’s faculty and students. In-depth exchanges and discussions were held covering basic topography scanning to advanced electrical mode operations, ensuring that researchers could quickly master the equipment and leverage its high-performance advantages.
 
Previously, TRUTH INSTRUMENTS’ atomic force microscopes have been adopted by numerous renowned universities including Peking University, Fudan University, Xiamen University and Northeastern University, covering a wide range of fields from basic physical and chemical research to advanced material development.
 
This delivery not only reflects Shanghai University’s recognition of TRUTH INSTRUMENTS, but also marks a solid step forward for the company in serving high-level research institutions and supporting the construction of "Double First-Class" disciplines. Going forward, TRUTH INSTRUMENTS will continue to focus on scenario-based solutions, providing robust support for China’s higher education and scientific and technological innovation.
 

MultiFunctional Atomic Force Microscope

 

The AtomEdge Pro Multifunctional Atomic Force Microscope enables sub-nanometer-scale 3D scanning, imaging and characterization of materials, electronic devices, biological samples, and other specimens, and is widely used in fields such as materials science, chemistry and environmental science, semiconductors, microelectronics, biomedicine, and more. Featuring multiple operating modes including contact,tapping, and non-contact, it offers users greater flexibility and precision in operation. Additionally, it integrates various functional modes such as Magnetic Force Microscopy, Electrostatic Force Microscopy, Scanning Kelvin Microscopy,and Piezoelectric Force Microscopy, delivering robust stability and excellent expandability. Furthermore, functional modules can be flexibly customized to meet specific user requirements,delivering tailored solutions for particular research fields and creating a highly efficient, multi-purpose inspection platform.


TRUTH INSTRUMENTS

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