Client Achievements | 《Applied Physics Letters》Observation of topological Hall effect in synthetic antiferromagnetic skyrmion system
Release time:
2026-04-15
Recently, a research team from the School of Integrated Circuits, Guangdong University of Technology has made important progress in the research field of topological Hall effect in synthetic antiferromagnetic skyrmion systems. The research was published in Applied Physics Letters, an authoritative journal in the field of applied physics, under the title "Observation of topological Hall effect in synthetic antiferromagnetic skyrmion system". The AtomEdge Pro Atomic Force Microscope (Magnetic Force Microscopy, MFM mode) independently developed by TRUTH INSTRUMENTS provided zero-field magnetic force microscopy (MFM) testing support for this research, successfully completed the zero-field skyrmion topography observation of the [Pt/Co/Ru]₂-based synthetic antiferromagnetic system, and provided direct and reliable experimental topography evidence for the key conclusions of this research.
In this research, the research team focused on the topological Hall effect of compensated and uncompensated [Pt/Co/Ru]₂-based synthetic antiferromagnetic skyrmion systems. The observation of the existence and stability of skyrmions under zero-field conditions is an important part of characterizing the magnetic structure of this system. The AtomEdge Pro Atomic Force Microscope from TRUTH INSTRUMENTS undertook the zero-field MFM testing work of this research, and carried out precise observation on two core samples: one is the uncompensated SAF sample (Co layer thickness x₁=1.6 nm, x₂=1.8 nm), and the other is the fully compensated SAF sample (Co layer thickness x₁=x₂=1.7 nm), completing the collection of skyrmion topography of the two samples under zero field.
The test results show that under the zero external magnetic field condition of μ₀H=0, the research team clearly observed the stable individual SAF skyrmions in the [Pt/Co/Ru]₂-based synthetic antiferromagnetic system: the diameter of skyrmions in the uncompensated sample is about 250 nm, and the diameter of skyrmions in the fully compensated sample is about 150 nm. Both types of skyrmions are stable under zero field, providing intuitive morphological evidence for the stable existence of skyrmions in this system at zero field. At the same time, this observation result is compared with the subsequent MFM test under external magnetic field, confirming the structural stability of skyrmions in this system in the magnetic field range from zero field to 20 mT.
The zero-field MFM test of the AtomEdge Pro Atomic Force Microscope directly provides real-space microscopic magnetic structure evidence, confirming that the [Pt/Co/Ru]₂-based synthetic antiferromagnetic skyrmions have zero-field stability in both compensated and uncompensated states. This result improves the understanding of the magnetic structure properties of this system and provides the necessary magnetic structure morphology basis for the observation of the topological Hall effect.
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