videobanner
TRUTH INSTRUMENTS
To True Precision Instruments

A national high-tech enterprise with high-end scientific research instruments, teaching instruments, and integrated circuit production line test equipment research and development and production as its main business.

READ MORE >>
TRUTH INSTRUMENTS
The atomic world at your fingertips

To True Precision Instruments Enabling Scientific and Technological Innovation with Precision Measurement

READ MORE >>
TRUTH INSTRUMENTS
To True Service

Timely response to localization services, scientific research and testing technical consultation, assistance in procurement demonstration, project application assistance, on-site installation and commissioning guidance

READ MORE >>
向下滑动 更多精彩

PRODUCTS


PRODUCTS


INDUSTRY SOLUTIONS


STRENGTH


26 Item

valid patent

19 Item

Software copyright

* Data as of June 30, 2024

To True Partners


Precision instruments have repeatedly helped Chinese researchers achieve high-level scientific research results.

We hope to cooperate with more outstanding researchers and continue to provide more professional technical services and perfect industry solutions.

One article to take you to understand the history of the development of scanning probe microscope

Aug 20,2024

One article to take you to understand the history of the development of scanning probe microscope

The history of Scanning probe Microscope (SPM) is a remarkable scientific progress, which lays the foundation of nanoscience and nanotechnology. Since the 1980 s, the emergence and preservation of SPM has not only enabled scientists to observe and manipulate materials with atomic and molecular precision, but also promoted research in many related fields. The following are the key milestones in SPM development:
Dry goods! Understanding Atomic Force Microscopy

Aug 20,2024

Dry goods! Understanding Atomic Force Microscopy

Atomic force Microscope (AFM) is a common scanning probe microscope, which uses the interaction between the micro-arm probe and the atomic force of the sample to detect the surface structure of the material. When the probe is close to the sample, the force between the two will cause the micro-cantilever to deflect or change in amplitude. These small changes are amplified by the optical lever and then captured by the detection system and converted into electrical signals, which are transmitted to the feedback system and the imaging system (as shown in the figure below). By recording a series of changes of the probe during the scanning process, the surface topography structure information is obtained.

Welcome to leave your information, access to free program planning!

TRUTH INSTRUMENTS

Provide reliable equipment for China's IC manufacturing, empowering technological innovation through precision measurement!

Contact Information

Telephone

Business Inquiries:+86-532-89267428/13335086685Manager Yao

Telephone

Switchboard:+86-532-89269848

Address

Company Address: 393 Songling Road, Laoshan District, Qingdao, Shandong Province, China

WeChat Public Number

WeChat Official Account

bilibili account

Bilibili Account